Title :
Irradiance and temperature transient sensitivity analysis for photovoltaic control
Author :
Kim, Katherine A. ; Krein, Philip T. ; Lee, Jay J. ; Bae, Hyunsu ; Cho, Bo-Hyung
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois Urbana-Champaign, Urbana, IL, USA
fDate :
May 30 2011-June 3 2011
Abstract :
This paper analyzes control scheme sensitivity to changes in irradiance and temperature around the maximum power point (MPP) for photovoltaic (PV) panels. Conventional control schemes such as constant voltage, current, and resistance, as well as a newly introduced voltage-offset resistance control (VRC) are compared. Based on experimental PV data and a validated model, VRC is found to have the lowest sensitivity to typical transients. Stability analysis of a buck and boost converter under VRC indicate that some ranges of the equivalent resistance are stable while others can cause instability. Two established PV control methods are assessed in terms of transient stability and three additional low-sensitivity methods utilizing VRC are outlined. These methods are applicable to PV controllers taking infrequent measurements that hold the control line steady between samples.
Keywords :
DC-DC power convertors; maximum power point trackers; photovoltaic power systems; power generation control; power system transient stability; sensitivity analysis; solar cells; voltage control; DC-DC converters; PV control methods; buck-boost converter; low-sensitivity methods; maximum power point tracker; photovoltaic control; photovoltaic panel; stability analysis; temperature transient sensitivity analysis; transient stability; voltage-offset resistance control; Resistance; Sensitivity; Temperature distribution; Temperature sensors; Transient analysis; Voltage control; Photovoltaic control; dc-dc converters; maximum power point tracking (MPPT); sensitivity;
Conference_Titel :
Power Electronics and ECCE Asia (ICPE & ECCE), 2011 IEEE 8th International Conference on
Conference_Location :
Jeju
Print_ISBN :
978-1-61284-958-4
Electronic_ISBN :
2150-6078
DOI :
10.1109/ICPE.2011.5944556