DocumentCode :
2108777
Title :
Multiple open-circuit fault diagnosis in voltage-fed PWM motor drives using the current Park´s Vector phase and the currents polarity
Author :
Freire, Nuno M A ; Estima, Jorge O. ; Cardoso, A. J Marques
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Coimbra, Coimbra, Portugal
fYear :
2011
fDate :
5-8 Sept. 2011
Firstpage :
397
Lastpage :
404
Abstract :
Presently, condition monitoring and fault diagnostics in electric drives are already considered essential to optimize maintenance operations and increase reliability levels. Regarding fault-tolerant inverters, it is well known that reliable fault diagnostic methods are mandatory to trigger remedial actions. This paper presents a diagnostic method for multiple open-circuit faults in pulse-width-modulation (PWM) voltage source inverters (VSI) feeding ac motors, with a special focus on the issue of false alarms during transients, such as load or speed changes. The diagnostic method combines a detection method based on derivative of the current Park´s Vector phase, which guarantees robustness to transients, with a localization method based on the currents polarity, which allows for multiple faults diagnosis. In order to prove the reliability and effectiveness of the proposed fault diagnostic method, several simulation and experimental results are presented, using a permanent magnet synchronous motor (PMSM) drive.
Keywords :
PWM invertors; fault diagnosis; fault tolerance; permanent magnet motors; reliability; synchronous motor drives; AC motors; PMSM drive; PWM VSI; current Park vector phase; current polarity; electric drives; fault-tolerant inverters; localization method; maintenance operation optimization; multiple open-circuit fault diagnosis; permanent magnet synchronous motor drive; pulse-width-modulation voltage source inverters; reliability levels; voltage-fed PWM motor drives; Circuit faults; Fault detection; Insulated gate bipolar transistors; Switches; Switching circuits; Transient analysis; Vectors; Fault diagnosis; multiple power switch open-circuit faults; pulse with modulation inverters; semiconductor device reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Diagnostics for Electric Machines, Power Electronics & Drives (SDEMPED), 2011 IEEE International Symposium on
Conference_Location :
Bologna
Print_ISBN :
978-1-4244-9301-2
Electronic_ISBN :
978-1-4244-9302-9
Type :
conf
DOI :
10.1109/DEMPED.2011.6063654
Filename :
6063654
Link To Document :
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