DocumentCode
2108871
Title
Readout Process & Noise Elimination Firmware for the Fermilab Beam Loss Monitor System
Author
Wu, Jinyuan ; Baumbaugh, Alan ; Drennan, Craig ; Thurman-Keup, Randy ; Lewis, Jonathan ; Shi, Zonghan
Author_Institution
Fermi Nat. Accel. Lab., Batavia
fYear
2007
fDate
April 29 2007-May 4 2007
Firstpage
1
Lastpage
8
Abstract
In the Fermilab beam loss monitor system, inputs from ion chambers are integrated for a short period of time, digitized and processed to create the accelerator abort request signals. The accelerator power supplies employing 3-phase 60 Hz AC cause noise at various harmonics on our inputs which must be eliminated for monitoring purposes. During accelerator ramping, both the sampling frequency and the amplitudes of the noise components change. As such, traditional digital filtering can partially reduce certain noise components but not all. A non-traditional algorithm was developed in our work to eliminate remaining ripples. The sequencing in the FPGA firmware is conducted by a micro-sequencer core we developed: the enclosed loop micro-sequencer (ELMS). The unique feature of the ELMS is that it supports the "FOR" loops with pre-defined iterations at the machine code level, which provides programming convenience and avoids many micro-complexities from the beginning.
Keywords
digital filters; field programmable gate arrays; ionisation chambers; particle beam diagnostics; position sensitive particle detectors; readout electronics; FPGA firmware; Fermilab; beam loss monitor system; digital filtering; enclosed loop microsequencer; frequency 60 Hz; ion chambers; noise elimination firmware; readout process; Frequency; Ion accelerators; Microprogramming; Monitoring; Particle beams; Power harmonic filters; Power supplies; Power system harmonics; Signal processing; Signal sampling; Digital Data Processing; Embedded System; FPGA; Micro-processor; Micro-sequencer; Reconfigurable Computing;
fLanguage
English
Publisher
ieee
Conference_Titel
Real-Time Conference, 2007 15th IEEE-NPSS
Conference_Location
Batavia, IL
Print_ISBN
978-1-4244-0866-5
Electronic_ISBN
978-1-4244-0867-2
Type
conf
DOI
10.1109/RTC.2007.4382756
Filename
4382756
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