• DocumentCode
    2109246
  • Title

    A power-efficient method to mitigate the EMI of Switched-Mode Power Supplies

  • Author

    Zeineddine, Khalid ; Uan-Zo-li, Alexander ; Chen, Chung-Hao ; Hahn, Jaehong ; Han, Dong-ho

  • Author_Institution
    Northwestern Univ., Evanston, IL, USA
  • fYear
    2011
  • fDate
    May 30 2011-June 3 2011
  • Firstpage
    453
  • Lastpage
    459
  • Abstract
    Modern microprocessors are predominately powered by the Switched-Mode Power Supplies. Fast switching of the power MOSFETs causes high-frequency voltage and current oscillations in the loop formed by the input decoupling and the MOSFETs. Such oscillations generate significant and broadband EMI noise. Conventional techniques to suppress this noise such as using snubbers, increasing MOSFET gate resistance or employing smaller MOSFETs result in higher power loss, shorter batter life and expensive cooling. This paper proposes an alternative approach to mitigate the EMI based on careful design of input decoupling. The paper shows how input decoupling can be optimized to provide low resistance path for low frequency ripple of the input current, while forcing high-frequency current to flow through a high resistance path. This method effectively increases the decay rate of the oscillations, which in turn decreases the EMI. This method was verified on two laptop designs and the experimental results showed 6dB of EMI reduction with no measurable degradation in the power efficiency.
  • Keywords
    electromagnetic interference; oscillations; power MOSFET; switched mode power supplies; EMI; MOSFET gate resistance; broadband EMI noise; high-frequency current oscillation; high-frequency voltage oscillation; power MOSFET; power efficient method; power loss; switched mode power supply; Capacitors; Electromagnetic interference; Inductance; MOSFETs; Oscillators; Switches; DC/DC Converters; EMI; Efficiency; Input Decoupling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and ECCE Asia (ICPE & ECCE), 2011 IEEE 8th International Conference on
  • Conference_Location
    Jeju
  • ISSN
    2150-6078
  • Print_ISBN
    978-1-61284-958-4
  • Electronic_ISBN
    2150-6078
  • Type

    conf

  • DOI
    10.1109/ICPE.2011.5944576
  • Filename
    5944576