DocumentCode :
2109246
Title :
A power-efficient method to mitigate the EMI of Switched-Mode Power Supplies
Author :
Zeineddine, Khalid ; Uan-Zo-li, Alexander ; Chen, Chung-Hao ; Hahn, Jaehong ; Han, Dong-ho
Author_Institution :
Northwestern Univ., Evanston, IL, USA
fYear :
2011
fDate :
May 30 2011-June 3 2011
Firstpage :
453
Lastpage :
459
Abstract :
Modern microprocessors are predominately powered by the Switched-Mode Power Supplies. Fast switching of the power MOSFETs causes high-frequency voltage and current oscillations in the loop formed by the input decoupling and the MOSFETs. Such oscillations generate significant and broadband EMI noise. Conventional techniques to suppress this noise such as using snubbers, increasing MOSFET gate resistance or employing smaller MOSFETs result in higher power loss, shorter batter life and expensive cooling. This paper proposes an alternative approach to mitigate the EMI based on careful design of input decoupling. The paper shows how input decoupling can be optimized to provide low resistance path for low frequency ripple of the input current, while forcing high-frequency current to flow through a high resistance path. This method effectively increases the decay rate of the oscillations, which in turn decreases the EMI. This method was verified on two laptop designs and the experimental results showed 6dB of EMI reduction with no measurable degradation in the power efficiency.
Keywords :
electromagnetic interference; oscillations; power MOSFET; switched mode power supplies; EMI; MOSFET gate resistance; broadband EMI noise; high-frequency current oscillation; high-frequency voltage oscillation; power MOSFET; power efficient method; power loss; switched mode power supply; Capacitors; Electromagnetic interference; Inductance; MOSFETs; Oscillators; Switches; DC/DC Converters; EMI; Efficiency; Input Decoupling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics and ECCE Asia (ICPE & ECCE), 2011 IEEE 8th International Conference on
Conference_Location :
Jeju
ISSN :
2150-6078
Print_ISBN :
978-1-61284-958-4
Electronic_ISBN :
2150-6078
Type :
conf
DOI :
10.1109/ICPE.2011.5944576
Filename :
5944576
Link To Document :
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