• DocumentCode
    2109274
  • Title

    Trench isolated thick SOI process for various optical and high voltage devices

  • Author

    Lerner, R. ; Gaebler, D. ; Schottmann, K. ; Hering, S.

  • Author_Institution
    Process - Dev., X-FAB Semicond. Foundries AG, Erfurt, Germany
  • fYear
    2013
  • fDate
    26-27 Sept. 2013
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    By using a trench isolated thick SOI process as base topology various optical and high voltage devices can be designed which are not or hardly possible in pn-junction isolated BCD processes. The trench isolation allows the construction of isolated photodiodes with excellent response even for red and infrared wavelengths. The thick SOI material enables the integration of vertical high voltage devices like NPN bipolar transistors. Together with a special collector design the buried layer and the sinker allow the integration of an IGBT device which is tune able between on-state and switching performance.
  • Keywords
    insulated gate bipolar transistors; isolation technology; photodiodes; power bipolar transistors; silicon-on-insulator; IGBT device; NPN bipolar transistors; high voltage devices; infrared wavelengths; isolated photodiodes; optical devices; trench isolated thick SOI process; Doping; Insulated gate bipolar transistors; Photodiodes; Silicon; Switches; Transistors; Voltage measurement; HV transistor; Trench; photo diode; thick SOI;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Conference Dresden-Grenoble (ISCDG), 2013 International
  • Conference_Location
    Dresden
  • Print_ISBN
    978-1-4799-1250-6
  • Type

    conf

  • DOI
    10.1109/ISCDG.2013.6656304
  • Filename
    6656304