• DocumentCode
    2109286
  • Title

    FinFET-based pseudo-spin-transistor: Design and performance

  • Author

    Shuto, Y. ; Yamamoto, Seiichi ; Sugahara, S.

  • Author_Institution
    Imaging Sci. & Eng. Lab., Tokyo Inst. of Technol., Yokohama, Japan
  • fYear
    2013
  • fDate
    26-27 Sept. 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    FinFET-based pseudo-spin-transistors referred to as pseudo-spin-FinFETs (PS-FinFETs) were computationally investigated, in which a high-performance FinFET and a spin-transfer-torque magnetic tunnel junction (STT-MTJ) were used to implement a PS-FinFET. The performance of PS-FinFETs was analyzed by HSPICE simulations using a predictive technology model of a FinFET and our developed STT-MTJ macromodel. The design method of PS-FinFETs was developed based on the systematic simulations. The application of PS-FinFETs to a nonvolatile SRAM cell was also explored. PS-FinFETs can introduce nonvolatile power-gating architecture into FinFET-based logic systems, leading to energy-efficient high-performance logic systems.
  • Keywords
    MOSFET; SPICE; SRAM chips; magnetic tunnelling; semiconductor device models; semiconductor device reliability; transistors; FinFET-based logic systems; FinFET-based pseudo-spin-transistor; HSPICE simulations; PS-FinFET performance; STT-MTJ macromodel; design method; energy-efficient high-performance logic systems; high-performance FinFET; nonvolatile SRAM cell; nonvolatile power-gating architecture; predictive technology model; pseudo-spin-FinFET; spin-transfer-torque magnetic tunnel junction; Computer integrated manufacturing; FinFETs; Magnetic tunneling; Magnetization; Negative feedback; SRAM cells; Tunneling magnetoresistance; FinFET; nonvolatile SRAM; power-gating; pseudo-spin-MOSFET; spin-transistor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Conference Dresden-Grenoble (ISCDG), 2013 International
  • Conference_Location
    Dresden
  • Print_ISBN
    978-1-4799-1250-6
  • Type

    conf

  • DOI
    10.1109/ISCDG.2013.6656305
  • Filename
    6656305