DocumentCode :
2109286
Title :
FinFET-based pseudo-spin-transistor: Design and performance
Author :
Shuto, Y. ; Yamamoto, Seiichi ; Sugahara, S.
Author_Institution :
Imaging Sci. & Eng. Lab., Tokyo Inst. of Technol., Yokohama, Japan
fYear :
2013
fDate :
26-27 Sept. 2013
Firstpage :
1
Lastpage :
4
Abstract :
FinFET-based pseudo-spin-transistors referred to as pseudo-spin-FinFETs (PS-FinFETs) were computationally investigated, in which a high-performance FinFET and a spin-transfer-torque magnetic tunnel junction (STT-MTJ) were used to implement a PS-FinFET. The performance of PS-FinFETs was analyzed by HSPICE simulations using a predictive technology model of a FinFET and our developed STT-MTJ macromodel. The design method of PS-FinFETs was developed based on the systematic simulations. The application of PS-FinFETs to a nonvolatile SRAM cell was also explored. PS-FinFETs can introduce nonvolatile power-gating architecture into FinFET-based logic systems, leading to energy-efficient high-performance logic systems.
Keywords :
MOSFET; SPICE; SRAM chips; magnetic tunnelling; semiconductor device models; semiconductor device reliability; transistors; FinFET-based logic systems; FinFET-based pseudo-spin-transistor; HSPICE simulations; PS-FinFET performance; STT-MTJ macromodel; design method; energy-efficient high-performance logic systems; high-performance FinFET; nonvolatile SRAM cell; nonvolatile power-gating architecture; predictive technology model; pseudo-spin-FinFET; spin-transfer-torque magnetic tunnel junction; Computer integrated manufacturing; FinFETs; Magnetic tunneling; Magnetization; Negative feedback; SRAM cells; Tunneling magnetoresistance; FinFET; nonvolatile SRAM; power-gating; pseudo-spin-MOSFET; spin-transistor;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Conference Dresden-Grenoble (ISCDG), 2013 International
Conference_Location :
Dresden
Print_ISBN :
978-1-4799-1250-6
Type :
conf
DOI :
10.1109/ISCDG.2013.6656305
Filename :
6656305
Link To Document :
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