DocumentCode
2109307
Title
Tearing based automatic abstraction for CTL model checking
Author
Woohyuk Lee ; Pardo, A. ; Jae-Young Jang ; Hachtel, G. ; Somenzi, F.
Author_Institution
ECEN Campus, Colorado Univ., Boulder, CO, USA
fYear
1996
fDate
10-14 Nov. 1996
Firstpage
76
Lastpage
81
Abstract
In this paper we present the tearing paradigm as a way to automatically abstract behavior to obtain upper and lower bound approximations of a reactive system. We present algorithms that exploit the bounds to perform conservative ECTL and ACTL model checking. We also give an algorithm for false negative (or false positive) resolution for verification based on a theory of a lattice of approximations. We show that there exists a bipartition of the lattice set based on positive versus negative verification results. Our resolution methods are based on determining a pseudo-optimal shortest path from a given, possibly coarse but tractable approximation, to a nearest point on the contour separating one set of the bipartition from the other.
Keywords
formal verification; logic CAD; sequential circuits; ACTL model checking; CTL model checking; bipartition; conservative ECTL; lattice set; lower bound approximations; pseudo-optimal shortest path; reactive system; resolution methods; tearing based automatic abstraction; upper bound approximations; Binary decision diagrams; Circuits; Contracts; Formal verification; Latches; Lattices; State-space methods; Upper bound;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design, 1996. ICCAD-96. Digest of Technical Papers., 1996 IEEE/ACM International Conference on
Conference_Location
San Jose, CA, USA
Print_ISBN
0-8186-7597-7
Type
conf
DOI
10.1109/ICCAD.1996.568969
Filename
568969
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