• DocumentCode
    2109795
  • Title

    On-the-Fly Evaluation of FPGA-Based True Random Number Generator

  • Author

    Santoro, Renaud ; Sentieys, Olivier ; Roy, Sébastien

  • Author_Institution
    IRISA, Univ. of Rennes, Rennes
  • fYear
    2009
  • fDate
    13-15 May 2009
  • Firstpage
    55
  • Lastpage
    60
  • Abstract
    Many embedded security chips require a high-quality digital True Random Number Generator (TRNG). Recently, some new TRNGs have been proposed in the literature, innovating by their new architectures. Moreover, some of them don´t need to use the post-processing unit usually required in TRNG constructions. As a result, the TRNG data rate is enhanced and the produced random bits only depend on the noise source and its sampling. However, selecting a TRNG can be a delicate problem. In a hardware context (e.g. Field-Programmable Gate Array (FPGA) or Application-Specific Integrated Circuit (ASIC) implementation), the design area and power consumption are important criterions. To the best of our knowledge, no effective comparison of several TRNGs appears in the literature. This paper evaluates the randomness behavior, the area and the power consumption of the latest TRNGs. These investigations are realized into real conditions, by implementing the TRNGs into FPGA circuits.
  • Keywords
    embedded systems; field programmable gate arrays; random number generation; security of data; FPGA-based true random number generator; data sampling; embedded security chip; enhanced TRNG data rate; field-programmable gate array; noise source; postprocessing unit; Application specific integrated circuits; Batteries; Circuit testing; Computer Society; Cryptography; Energy consumption; Field programmable gate arrays; Hardware; Random number generation; Very large scale integration; FPGA; randomness evaluation; statistical test; true random number generator;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI, 2009. ISVLSI '09. IEEE Computer Society Annual Symposium on
  • Conference_Location
    Tampa, FL
  • Print_ISBN
    978-1-4244-4408-3
  • Electronic_ISBN
    978-0-7695-3684-2
  • Type

    conf

  • DOI
    10.1109/ISVLSI.2009.33
  • Filename
    5076383