• DocumentCode
    2109924
  • Title

    Impulse testing as a predictive maintenance tool

  • Author

    Wiedenbrug, E. ; Frey, G. ; Wilson, J.

  • Author_Institution
    Baker Instrum. Co., Fort Collins, CO, USA
  • fYear
    2003
  • fDate
    24-26 Aug. 2003
  • Firstpage
    13
  • Lastpage
    19
  • Abstract
    Impulse testing has been an integral part of predictive maintenance of electrical motors for many years. The influence that extensive impulse testing has on a motor is investigated in this paper. The questions investigated are the following: can impulse testing damage healthy or deteriorated insulation? Can weak turn-to-turn insulation be diagnosed with DC resistance, inductance, Megger or HiPot tests? Are motors with weak insulation, as proven by impulse testing, able to operate after failing the test? Are motors that show a turn-turn short capable of continued operation? These questions have been investigated by putting two low voltage motors through exhaustive testing rigors, until a failure was induced. Following the failure, additional testing allowed further investigation designed to determine the possible deteriorating effects on turn-turn insulation due to impulse testing beyond the motor´s dielectric breakdown.
  • Keywords
    electric motors; electric resistance measurement; impulse testing; inductance measurement; machine insulation; machine testing; maintenance engineering; 460 V; 5 hp; DC resistance tests; HiPot tests; Megger tests; deteriorated insulation; dielectric breakdown; extensive impulse testing; failure; healthy insulation; impulse testing; inductance tests; insulation damage; low voltage motors; predictive maintenance tool; turn-turn short; weak turn-to-turn insulation; Costs; Dielectrics and electrical insulation; Failure analysis; Impulse testing; Inductance; Insulation testing; Predictive maintenance; Stators; Voltage; Welding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Diagnostics for Electric Machines, Power Electronics and Drives, 2003. SDEMPED 2003. 4th IEEE International Symposium on
  • Print_ISBN
    0-7803-7838-5
  • Type

    conf

  • DOI
    10.1109/DEMPED.2003.1234540
  • Filename
    1234540