DocumentCode :
2110319
Title :
Voltage Inversion due to TCSC Presence on Second Circuit of Double Circuit Line and Distance Relay Mal-Operation Considering MOV Operation
Author :
Jamali, S. ; Kazemi, A. ; Shateri, H.
Author_Institution :
Center of Excellence for Power Syst. Autom. & Oper., Iran Univ. of Sci. & Technol., Tehran
fYear :
2008
fDate :
17-20 April 2008
Firstpage :
1
Lastpage :
6
Abstract :
This paper discusses the distance relay mal-operation in the case of installation of thyristor controlled series compensator (TCSC), one of the series connected flexible alternating current transmission system (FACTS) device, on the second circuit of a double circuit transmission line, considering its metal oxide varistor (MOV) operation. This is done by means of presenting the measured impedance at the relaying point in the case of TCSC presence at the near end of the second circuit. The measured impedance at the relaying point is greatly influenced in the presence of TCSC on the line or even in the case of installing TCSC on the near end of the second circuit. The measured impedance depends on many factors including the power system structural conditions, pre-fault loading, the ground fault resistance, and TCSC compensation degree.
Keywords :
electric impedance measurement; flexible AC transmission systems; power system relaying; power transmission lines; power transmission protection; relay protection; static VAr compensators; thyristor applications; varistors; FACTS device; MOV operation; TCSC; distance relay mal-operation; flexible alternating current transmission system; impedance measurement; metal oxide varistor; second circuit-double circuit transmission line; thyristor controlled series compensator; voltage inversion; Control systems; Flexible AC transmission systems; Flexible printed circuits; Impedance measurement; Power capacitors; Power system relaying; Protective relaying; Thyristors; Transmission line measurements; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Region 5 Conference, 2008 IEEE
Conference_Location :
Kansas City, MO
Print_ISBN :
978-1-4244-2076-6
Electronic_ISBN :
978-1-4244-2077-3
Type :
conf
DOI :
10.1109/TPSD.2008.4562746
Filename :
4562746
Link To Document :
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