DocumentCode
2110459
Title
Fast Template Matching System Using VHDL
Author
Tate, Richard ; Northern, James, III
Author_Institution
Dept. of Electr. & Comput. Eng., Prairie View A&M Univ., Prairie View, TX
fYear
2008
fDate
17-20 April 2008
Firstpage
1
Lastpage
5
Abstract
The image template matching problem is one of the fundamental problems of and has many practical applications in image processing, pattern recognition, and computer vision. It is a useful operation for filtering, edge detection, image registration, and object detection. Template matching is the process of determining the presence and the location of a reference image of an object inside a scene image under analysis by a spatial cross-correlation process. Conventional cross- correlation type algorithms are computationally expensive. In this paper, a method of fast image template matching algorithm based on template modeling is proposed. Taken advantage of fast searching techniques, the method can achieve high computing efficiency and good matching results. Furthermore a comparison of the performance provided by this method and conventional matching algorithms is discussed. Theoretical analysis and simulation results show that the proposed algorithm is very effective. Simple hardware architecture is presented and implemented, where it executes matching for a 4times4 template on a 16 times 16 target image.
Keywords
edge detection; filtering theory; hardware description languages; image matching; image registration; object detection; VHDL; computer vision; edge detection; filtering operation; image processing; image registration; object detection; pattern recognition; searching techniques; spatial cross-correlation process; template matching system; Application software; Computer vision; Filtering; Image edge detection; Image processing; Image registration; Layout; Object detection; Pattern matching; Pattern recognition; Image recognition; optimization; signal processing; template matching;
fLanguage
English
Publisher
ieee
Conference_Titel
Region 5 Conference, 2008 IEEE
Conference_Location
Kansas City, MO
Print_ISBN
978-1-4244-2076-6
Electronic_ISBN
978-1-4244-2077-3
Type
conf
DOI
10.1109/TPSD.2008.4562754
Filename
4562754
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