Title :
All Digital Duty Cycle Correction Circuit in 90nm Based on Mutex
Author :
Swathi, R. ; Srinivas, M.B.
Author_Institution :
Center for VLSI & Embedded Syst. Technol., Int. Inst. of Inf. Technol.
Abstract :
A duty cycle correction circuit (DCC) for high frequency clocks with fine resolution is designed and tested at 1.2 V in 90 nm CMOS process. Spice simulations show that this duty cycle corrector can adjust the output duty cycle to 50 plusmn 0.5% with input clock at 500 MHz and input duty cycle ranging from20% to 80%. DCC will not introduce any delay in the forward path, which makes it suitable for multi-phase clock applications. The proposed implementation uses the high frequency delay line and MUTEX (mutual exclusion element) based circuit for achieving high resolution.
Keywords :
CMOS digital integrated circuits; SPICE; clocks; delay lines; CMOS process; MUTEX; Spice simulation; duty cycle correction circuit; frequency clock; frequency delay line; mutual exclusion element-based circuit; Circuit simulation; Circuit testing; Clocks; Delay effects; Delay lines; Detectors; Flip-flops; Frequency; Pulse generation; Very large scale integration; DDRSRAM; Duty cycle correction; mutex;
Conference_Titel :
VLSI, 2009. ISVLSI '09. IEEE Computer Society Annual Symposium on
Conference_Location :
Tampa, FL
Print_ISBN :
978-1-4244-4408-3
Electronic_ISBN :
978-0-7695-3684-2
DOI :
10.1109/ISVLSI.2009.41