• DocumentCode
    2110775
  • Title

    Design of VBE Referenced Bootstrap Current Source, Sensitivity, and Self-Heating Effect

  • Author

    Hossain, Md M. ; Davis, W. Alan ; Russell, Howard T., Jr. ; Carter, Ronald L.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., St. Cloud State Univ., St. Cloud, MN
  • fYear
    2008
  • fDate
    17-20 April 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents the design of a VBE based bootstrap (self-bias) current source and self-heating effects on its performance. The performance of this reference circuit is measured by the sensitivity of the output current with respect to the power supply voltage. The self-heating effect on the base emitter voltage and the output resistance of a device is used to clarify the design requirements. Based upon the basic principle of the VBE referenced bootstrap current source, several combinations of current sources and current mirrors are used for the design to compensate the self-heating effect that degrades the circuit´s sensitivity. Simulation and measurement results validate the design and show that the proposed current source has improved sensitivity and is less affected by self-heating over the conventional bootstrapped VBE referenced current source. The circuits have been realized using dielectrically isolated bipolar junction technology (DIBJT) with the vertical bipolar inter-company (VBIC) model.
  • Keywords
    bipolar integrated circuits; bootstrap circuits; constant current sources; network synthesis; reference circuits; sensitivity analysis; bootstrap current source; circuit sensitivity; current mirrors; dielectrically isolated bipolar junction technology; emitter voltage; power supply voltage; reference circuit; self-heating effects; vertical bipolar inter-company model; Circuit simulation; Current measurement; Degradation; Dielectric measurements; Electrical resistance measurement; Isolation technology; Mirrors; Power measurement; Power supplies; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Region 5 Conference, 2008 IEEE
  • Conference_Location
    Kansas City, MO
  • Print_ISBN
    978-1-4244-2076-6
  • Electronic_ISBN
    978-1-4244-2077-3
  • Type

    conf

  • DOI
    10.1109/TPSD.2008.4562767
  • Filename
    4562767