• DocumentCode
    2111366
  • Title

    Comprehensive CM filter design to suppress conducted EMI for SiC-JFET motor drives

  • Author

    Gong, Xun ; Josifovic, Ivan ; Ferreira, J.A.

  • Author_Institution
    Delft Univ. of Technol., Delft, Netherlands
  • fYear
    2011
  • fDate
    May 30 2011-June 3 2011
  • Firstpage
    720
  • Lastpage
    727
  • Abstract
    This paper proposes a comprehensive EMI common-mode (CM) filter design procedure to suppress conducted EMI in silicon carbide (SiC) JFETs based inverter-fed motor drive systems. The first part of this paper is focusing on analyzing the EMC issue arisen from the newly generated power semiconductor device - SiC JFET, where the switching dynamics of SiC JFET and Si IGBT with the same power flowing level are compared. Then the second part towards EMI suppression for the inverter prototype. A comprehensive EMI CM filter design procedure is proposed. The proposed CM equivalent circuit model is able to evaluate the filter insertion loss gains over the whole conducted EMI frequency range, thereby different filter topologies can be compared and optimally selected. The performed experiments form the guideline that exhibits the process how the generated conducted EMI from the built inverter prototype is successfully suppressed to comply with the IEC61800-3 standard step by step.
  • Keywords
    electromagnetic interference; equivalent circuits; junction gate field effect transistors; power semiconductor devices; silicon compounds; wide band gap semiconductors; CM equivalent circuit model; EMI common-mode filter design; EMI suppression; SiC; SiC-JFET motor drives; conducted EMI; filter topologies; inverter-fed motor drive systems; power semiconductor device; Electromagnetic interference; Frequency measurement; Inverters; JFETs; Noise; Silicon carbide; Switches; Common-mode (CM); Electromagnetic interference (EMI); Motor Drive; Silicon Carbide (SiC);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and ECCE Asia (ICPE & ECCE), 2011 IEEE 8th International Conference on
  • Conference_Location
    Jeju
  • ISSN
    2150-6078
  • Print_ISBN
    978-1-61284-958-4
  • Electronic_ISBN
    2150-6078
  • Type

    conf

  • DOI
    10.1109/ICPE.2011.5944649
  • Filename
    5944649