Title :
A robust random number generator based on a differential current-mode chaos
Author :
Katz, Oded ; Ramon, Dan A. ; Wagner, Israel A.
Author_Institution :
IBM Haifa Labs., Haifa
Abstract :
This paper demonstrates a differential current-mode chaos-based circuit used to generate random number sequences, which was implemented on 90 nm CMOS-SOI technology. The proposed design implements an improved and robust chaotic map, and diminishes non-idealities such as asymmetry, offset. Randomness tests were conducted and show the advantages of the differential chaos circuit.
Keywords :
CMOS digital integrated circuits; chaos; random number generation; random sequences; silicon-on-insulator; CMOS-SOI technology; differential chaos circuit; differential current-mode chaos; random number sequences; randomness tests; robust chaotic map; robust random number generator; size 90 nm; CMOS technology; Chaos; Circuit testing; Difference equations; Linearity; Nonlinear equations; Random number generation; Robustness; Transfer functions; Voltage;
Conference_Titel :
Microwaves, Communications, Antennas and Electronic Systems, 2008. COMCAS 2008. IEEE International Conference on
Conference_Location :
Tel-Aviv
Print_ISBN :
978-1-4244-2097-1
Electronic_ISBN :
978-1-4244-2098-8
DOI :
10.1109/COMCAS.2008.4562804
