• DocumentCode
    2111510
  • Title

    Distinguishing near-falls from daily activities with wearable accelerometers and gyroscopes using Support Vector Machines

  • Author

    Aziz, Omar ; Park, Edward J. ; Mori, Greg ; Robinovitch, Stephen N.

  • Author_Institution
    Sch. of Eng. Sci., Simon Fraser Univ., Burnaby, BC, Canada
  • fYear
    2012
  • fDate
    Aug. 28 2012-Sept. 1 2012
  • Firstpage
    5837
  • Lastpage
    5840
  • Abstract
    Falls are the number one cause of injury in older adults. An individual´s risk for falls depends on his or her frequency of imbalance episodes, and ability to recover balance following these events. However, there is little direct evidence on the frequency and circumstances of imbalance episodes (near falls) in older adults. Currently, there is rapid growth in the development of wearable fall monitoring systems based on inertial sensors. The utility of these systems would be enhanced by the ability to detect near-falls. In the current study, we conducted laboratory experiments to determine how the number and location of wearable inertial sensors influences the accuracy of a machine learning algorithm in distinguishing near-falls from activities of daily living (ADLs).
  • Keywords
    accelerometers; biomechanics; biomedical measurement; geriatrics; gyroscopes; learning (artificial intelligence); medical signal processing; patient monitoring; signal classification; support vector machines; activities of daily living; daily activities; imbalance episode frequency; inertial sensors; machine learning algorithm; near fall classification; older adults; support vector machines; wearable accelerometers; wearable fall monitoring systems; wearable gyroscopes; Accelerometers; Educational institutions; Foot; Sensitivity; Sensors; Support vector machines; Thigh; Accelerometry; Adult; Algorithms; Humans; Support Vector Machines; Young Adult;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-4119-8
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/EMBC.2012.6347321
  • Filename
    6347321