• DocumentCode
    2111685
  • Title

    Design and realization of a credit card size driver stage for high power thyristor based devices with integrated MOS structure

  • Author

    Bragard, Michael ; Gottschlich, Jan ; De Doncker, Rik W.

  • Author_Institution
    Inst. for Power Electron. & Electr. Drives (ISEA), RWTH Aachen Univ., Aachen, Germany
  • fYear
    2011
  • fDate
    May 30 2011-June 3 2011
  • Firstpage
    1182
  • Lastpage
    1189
  • Abstract
    The Emitter Turn-off Thyristor (ETO) is an advantageous concept in sense of a MOS gated thyristor device. The innovative integration of the MOSFETs inside the press-pack housing allows a cable connection between the high power device and the external gate driver. After a short introduction, this paper focuses on the design and the realization of the external driver stage. Besides a mechanical and thermal decoupling of the driver from the high voltage device, the advantages are an extremely compact design in credit card dimensions. Today´s IGCT solutions require typically A4 format (210 mm × 297 mm). Measurements of the prototype prove a significant lower power consumption, which stays far below 5 W at all operating conditions. Additional functionality is demonstrated by short circuit detection and handling.
  • Keywords
    MOS-controlled thyristors; driver circuits; semiconductor device packaging; short-circuit currents; IGCT; MOS gated thyristor device; MOSFET; credit card size driver stage; emitter turn-off thyristor; high power thyristor based device; high voltage device; integrated MOS structure; integrated gate controlled thyristor; mechanical decoupling; press-pack housing; short circuit detection; short circuit handling; thermal decoupling; Capacitors; Current measurement; Driver circuits; Logic gates; MOSFETs; Temperature measurement; Thyristors; ETO; Gate Driver; Integrated Emitter Turn-off Thyristor (IETO); MOS commutated;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and ECCE Asia (ICPE & ECCE), 2011 IEEE 8th International Conference on
  • Conference_Location
    Jeju
  • ISSN
    2150-6078
  • Print_ISBN
    978-1-61284-958-4
  • Electronic_ISBN
    2150-6078
  • Type

    conf

  • DOI
    10.1109/ICPE.2011.5944661
  • Filename
    5944661