• DocumentCode
    2112029
  • Title

    Modelling Of Surface Reactions For Predicting Dry-etched Profiles

  • Author

    Harafuji, K. ; Misaka, A. ; Kubota, M. ; Nomura, N.

  • Author_Institution
    Matsushita Electric Ind. Co., Ltd.
  • fYear
    1993
  • fDate
    14-15 May 1993
  • Firstpage
    76
  • Lastpage
    79
  • Keywords
    Amplitude shift keying; Chemicals; Dry etching; Flowcharts; Predictive models; Sputter etching; Sputtering; Substrates; Surface cleaning; Topology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Process and Device Modeling, 1993. (1993 VPAD) 1993 International Workshop on
  • Print_ISBN
    0-7803-1338-0
  • Type

    conf

  • DOI
    10.1109/VPAD.1993.724729
  • Filename
    724729