Title :
A new approach for automated characterization of high speed serial interfaces of SoC
Author :
Fefer, Y. ; Rysin, A. ; Mantel, O.
Author_Institution :
Freescale Semicond. Israel Ltd., Herzelia
Abstract :
The testing approach described in the paper proposes to reduce the time required for HSSI characterization by testing the devices according to specially developed PHY specifications, instead of direct testing of all electrical parameters required by the supported standards, and introducing an automated testing setup, based on an automated active probing solution.
Keywords :
semiconductor device testing; system-on-chip; PHY specifications; SoC; automated active probing solution; automated characterization; automated testing setup; electrical parameters; high speed serial interfaces; Automatic testing; Circuit testing; Distortion; Integrated circuit interconnections; Physical layer; Power system interconnection; Protocols; Standards development; Test equipment; Very large scale integration;
Conference_Titel :
Microwaves, Communications, Antennas and Electronic Systems, 2008. COMCAS 2008. IEEE International Conference on
Conference_Location :
Tel-Aviv
Print_ISBN :
978-1-4244-2097-1
Electronic_ISBN :
978-1-4244-2098-8
DOI :
10.1109/COMCAS.2008.4562825
