Title :
A Single-Bit and Double-Adjacent Error Correcting Parallel Decoder for Multiple-Bit Error Correcting BCH Codes
Author :
Namba, Kazuteru ; Pontarelli, Salvatore ; Ottavi, Marco ; Lombardi, Floriana
Author_Institution :
Grad. Sch. of Adv. Integration Sci., Chiba Univ., Chiba, Japan
Abstract :
This paper presents a novel high-speed BCH decoder that corrects double-adjacent and single-bit errors in parallel and serially corrects multiple-bit errors other than double-adjacent errors. Its operation is based on extending an existing parallel BCH decoder that can only correct single-bit errors and serially corrects double-adjacent errors at low speed. The proposed decoder is constructed by a novel design and is suitable for nanoscale memory systems, in which multiple-bit errors occur at a probability comparable to single-bit errors and double-adjacent errors occur at a higher probability (nearly two orders of magnitude) than other multiple-bit errors. Extensive simulation results are reported. Compared with the existing scheme, the area and delay time of the proposed decoder are on average 11% and 6% higher, but its power consumption is reduced by 9% on average. This paper also shows that the area, delay, and power overheads incurred by the proposed scheme are significantly lower than traditional fully parallelized BCH decoders capable of correcting any double-bit errors in parallel.
Keywords :
BCH codes; error correction codes; probability; telecommunication power management; delay time; double adjacent error correcting parallel BCH decoder; multiplebit error correcting BCH codes; nanoscale memory system; power consumption reduction; power overhead; probability; single bit error correcting parallel decoder; Decoding; Detectors; Error correction; Error correction codes; Generators; Inverters; Logic gates; BCH codes; Error correcting code (ECC); double-adjacent error correction (DAEC); parallel decoder;
Journal_Title :
Device and Materials Reliability, IEEE Transactions on
DOI :
10.1109/TDMR.2014.2309935