DocumentCode
2112285
Title
Hybrid approach for RF MEMS devices
Author
Aharon, O. ; Gal, L. ; Nemirovsky, Y.
Author_Institution
Dept. of Electr. Eng., Technion-Israel Inst. of Technol., Haifa
fYear
2008
fDate
13-14 May 2008
Firstpage
1
Lastpage
10
Abstract
This work presents the RF design considerations of electro-mechanical MEMS structures realized by the hybrid approach. Modeling of the MEMS devices capacitance in up state is different than for surface micromachined devices, due to significant fringing fields. RF MEMS demonstrators as switch and inductor have been modeled, simulated and RF characterized. The fabrication of the hybrid devices has been performed using bulk micromachining of an SOI wafer, followed by a vertical integration with a GaAs and InP circuit substrates.
Keywords
III-V semiconductors; gallium arsenide; indium compounds; micromachining; micromechanical devices; silicon-on-insulator; GaAs; InP; RF MEMS devices; RF design considerations; SOI wafer; bulk micromachining; electro-mechanical MEMS structures; fringing fields; hybrid approach; hybrid devices fabrication; surface micromachined devices; vertical integration; Capacitance; Circuit simulation; Fabrication; Inductors; Microelectromechanical devices; Micromechanical devices; Radio frequency; Radiofrequency microelectromechanical systems; Semiconductor device modeling; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwaves, Communications, Antennas and Electronic Systems, 2008. COMCAS 2008. IEEE International Conference on
Conference_Location
Tel-Aviv
Print_ISBN
978-1-4244-2097-1
Electronic_ISBN
978-1-4244-2098-8
Type
conf
DOI
10.1109/COMCAS.2008.4562834
Filename
4562834
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