Linear voltage regulator susceptibility to conducted EMI

Author

Fiori, Franco ; Crovetti, Paolo S.

Author_Institution

Dept. of Electron., Politecnico di Torino

Volume

4

fYear

2002

fDate

2002

Firstpage

1398

Abstract

In this paper the susceptibility of voltage regulator circuits to electromagnetic interference is analyzed by experimental measurements. This analysis highlights two different effects of EMI on this circuit, for different levels of the injected power: an offset in the regulated voltage for low-level injection and a complete circuit failure for high-level injection. Both these effects are essentially related to the nonlinear behavior of the operational amplifier included in the circuit, in particular, the offset in the regulated voltage can be ascribed to previously investigated nonlinear effects of RFI on operational amplifiers input terminals and/or power supply rails.

Keywords

electric noise measurement; electromagnetic interference; operational amplifiers; radiofrequency interference; voltage regulators; RFI; complete circuit failure; conducted EMI; electromagnetic interference; high-level injection; injected power; linear voltage regulator susceptibility; low-level injection; nonlinear behavior; operational amplifier; operational amplifiers; power supply rails;

fLanguage

English

Publisher

ieee

Conference_Titel

Industrial Electronics, 2002. ISIE 2002. Proceedings of the 2002 IEEE International Symposium on

Print_ISBN

0-7803-7369-3

Type

conf

DOI

10.1109/ISIE.2002.1025999

Filename

1025999