Title :
Nanoscale resolution image plane holographic microscopy
Author :
Nejdl, Jaroslav ; Howlett, Isela ; Monserut, N. ; Paterson, David ; Anderson, E.H. ; Chao, W. ; Marconi, Mario ; Rocca, Jorge J. ; Menoni, C.S.
Author_Institution :
Nat. Sci. Found. Eng. Res. Center for Extreme Ultraviolet Sci. & Technol., USA
Abstract :
We demonstrate nanoscale spatial resolution image plane holographic microscopy at extreme ultraviolet wavelengths. We show the advantages of the method for imaging test pattern samples with an absorption contrast of ~30%.
Keywords :
holography; image resolution; optical microscopy; absorption contrast; extreme ultraviolet wavelengths; holographic microscopy; imaging test pattern; nanoscale spatial resolution image plane; Laser beams; Microscopy; Ultraviolet sources; X-ray imaging; X-ray lasers;
Conference_Titel :
Photonics Conference (IPC), 2013 IEEE
Conference_Location :
Bellevue, WA
Print_ISBN :
978-1-4577-1506-8
DOI :
10.1109/IPCon.2013.6656438
