Title :
Automotive diodes-a screening method
Author_Institution :
S.C. Baneasa S.A., Bucharest, Romania
Abstract :
An investigation upon a method for screening and quick estimate of the reliability of automotive rectifier diodes in the DO21 case is presented. The aim was to analyse if the standard tests, RTV (rapid thermal variations) and HTS (high temperature storage), can constitute a good estimate of reliability of diodes. One aimed to reach to a better interpretation of test results and the choice of efficient screening method
Keywords :
automotive electronics; failure analysis; semiconductor device reliability; semiconductor device testing; semiconductor diodes; solid-state rectifiers; DO21; HTS; RTV; automotive diodes; automotive rectifier diodes; high temperature storage; rapid thermal variations; reliability; screening method; standard tests; Automotive engineering; High temperature superconductors; Materials testing; Performance evaluation; Rectifiers; Semiconductor devices; Semiconductor diodes; Thermal degradation; Vehicle dynamics; Virtual reality;
Conference_Titel :
Semiconductor Conference, 1997. CAS '97 Proceedings., 1997 International
Conference_Location :
Sinaia
Print_ISBN :
0-7803-3804-9
DOI :
10.1109/SMICND.1997.651169
