DocumentCode
2113403
Title
A framework for risk management and end-of-life (EOL) analysis for nanotechnology products: A case study in lithium-ion batteries
Author
Olapiriyakul, Sun ; Caudill, Reggie J.
Author_Institution
New Jersey Inst. of Technol., Univ. Heights, Newark, NJ
fYear
2008
fDate
19-22 May 2008
Firstpage
1
Lastpage
6
Abstract
The objective of this study is to formulate a framework to assess environmental impacts and risk associated with products containing nanomaterials. The research presented here focuses on the end-of-life (EOL) management and recycling of lithium-ion (Li-ion) batteries. The concerns regarding nanoenabled Li-ion batteries are both timely and important as these products are already in the marketplace and moving into the waste stream. While further research is underway, the initial material engineering assessment and process analysis show that current battery recycling operations may need to be modified and process parameters adjusted to accommodate these new Li-ion batteries or unexpected and unwanted impacts may occur. Preliminary findings indicate that filtration systems may release nanoparticles into the atmosphere; process outputs may be contaminated by unexpected nanostructures; and process wastes may contain hazardous or toxic nanomaterials. As described, additional research is necessary to further quantify these impacts and to validate recommendations for process improvement.
Keywords
nanotechnology; remaining life assessment; risk management; secondary cells; end-of-life analysis; filtration systems; initial material engineering assessment; lithium-ion batteries; nanotechnology; risk management; Atmosphere; Battery management systems; Filtration; Nanomaterials; Nanoparticles; Nanostructures; Nanotechnology; Recycling; Risk analysis; Risk management; battery recycling; environmental impact analysis; nanomaterials; nanotechnology; recycling processes;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics and the Environment, 2008. ISEE 2008. IEEE International Symposium on
Conference_Location
San Francisco, CA
Print_ISBN
978-1-4244-2272-2
Electronic_ISBN
978-1-4244-2298-2
Type
conf
DOI
10.1109/ISEE.2008.4562877
Filename
4562877
Link To Document