• DocumentCode
    2113460
  • Title

    Effects Of Nitride Viscosity On The Stress Distribution In LOCOS Structure

  • Author

    Kuroda, S. ; Okihara, M. ; Hirashita, N. ; Nishi, K.

  • Author_Institution
    OKI Electric Industry Co., Ltd.
  • fYear
    1993
  • fDate
    14-15 May 1993
  • Firstpage
    90
  • Lastpage
    91
  • Keywords
    Compressive stress; Elasticity; Electron devices; Equations; Oxidation; Research and development; Shape; Silicon; Very large scale integration; Viscosity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Process and Device Modeling, 1993. (1993 VPAD) 1993 International Workshop on
  • Print_ISBN
    0-7803-1338-0
  • Type

    conf

  • DOI
    10.1109/VPAD.1993.724734
  • Filename
    724734