• DocumentCode
    2113658
  • Title

    Hysteresis modeling with least squares support vector machines

  • Author

    Kang Chuanhui ; Wang Xiaodong ; Wang Ke ; Chang Jianli

  • Author_Institution
    Dept. of Electron. Eng., Zhejiang Normal Univ., Jinhua, China
  • fYear
    2010
  • fDate
    29-31 July 2010
  • Firstpage
    1330
  • Lastpage
    1333
  • Abstract
    The least squares support vector machines (LS-SVMs) are proposed for hysteresis system modeling in this investigation. The historical information of hysteresis system is used as a part of the input signals of the LS-SVMs so that the many-to-one mapping of hysteresis system is transformed into a one-to-one mapping. Utilizing the nonlinear approximation ability of LS-SVMs, a dynamic hysteresis model can be obtained by the proposed method. A soft magnetic material has been used as an example for demonstrating the effectiveness of the LS-SVM method. As a comparison, the popular neural networks (NNs) are also applied to the hysteresis system modeling. The experimental results show that the proposed method has an advantage over NNs in modeling accuracy and training time. In terms of the demonstration of soft magnetic material, the LS-SVMs have one order of magnitude lower than the NNs in modeling error. Also, the training time of LS-SVMs is only one-third of the NNs. These mean that the LS-SVM method overcomes some shortcomings of NN method in hysteresis system modeling.
  • Keywords
    electrical engineering computing; least squares approximations; magnetic hysteresis; neural nets; soft magnetic materials; support vector machines; hysteresis system modeling; least squares support vector machines; many-to-one mapping; neural networks; nonlinear approximation ability; one-to-one mapping; soft magnetic material; Artificial neural networks; Electronic mail; Magnetic hysteresis; Mathematical model; Modeling; Soft magnetic materials; Support vector machines; Hysteresis; Least Squares Support Vector Machines; Modeling; Neural Networks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control Conference (CCC), 2010 29th Chinese
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-6263-6
  • Type

    conf

  • Filename
    5573672