Title :
Simulation and Analysis for Typical Package Assembly Manufacture
Author :
Yong Liu ; Irving, Samuel ; Desbiens, D. ; Timwah Luk
Author_Institution :
Fairchild Semicond. Corp., South Portland, ME
Abstract :
The manufacturing process for package assembly is a key to assuring the reliability and quality of the semiconductor products. There are a significant number of challenging mechanics problems in assembly manufacturing process that may lead to the failure of die, delamination and package cracking. Identifying potential root causes of quality and reliability problems during the development of an assembly process and during package design is very important; it can reduce scrap during manufacturing, save development time, as well as help insure the product meets the requirements of customers. Simulation can find the root cause quickly and accurately, leading to reduced time and cost. It enables experiments that are too costly to be done by empirical methods. Using simulation we can find the conditions that optimize cost, performance and reliability under different sets of conditions. This paper focuses on modeling and simulation for typical package assembly manufacture processes which have large impact to the product quality and reliability. A finite element framework is developed to simulate the assembly package manufacturing process utilizing the ANSYS software platform. The framework tools are utilized to maximize the robustness of the assembly process in order to eliminate reliability issues, fast run time and minimize costs in development and from manufacturing scrap
Keywords :
assembling; electronics packaging; failure analysis; finite element analysis; manufacturing processes; semiconductor process modelling; ANSYS software; assembly manufacturing process; finite element analysis; package assembly manufacture; package design; product quality; product reliability; semiconductor products; Analytical models; Assembly; Costs; Delamination; Lead time reduction; Manufacturing processes; Semiconductor device manufacture; Semiconductor device packaging; Semiconductor device reliability; Virtual manufacturing;
Conference_Titel :
Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2006. EuroSime 2006. 7th International Conference on
Conference_Location :
Como
Print_ISBN :
1-4244-0275-1
DOI :
10.1109/ESIME.2006.1643949