Title :
Case studies in energy use to realize ultra-high purities in semiconductor manufacturing
Author :
Krishnan, Nikhil ; Williams, Eric D. ; Boyd, Sarah B.
Author_Institution :
Dept. of Earth & Environ. Eng., Columbia Univ., New York, NY
Abstract :
With increasing sophistication of products, there is a general trend towards higher purity (lower tolerances) in materials and parts. The purification of input materials and the need to create low-entropy environments in manufacturing lead to significant energy and materials use - referred to as secondary materialization. In this article we explore secondary materialization in semiconductor manufacturing by characterizing energy use trends for three cases: cleanrooms, producing ultrapure water (UPW), and purifying elemental gases. For purification of water and elemental gases, increasing purity standards are correlated with dramatic increases in energy use. For cleanrooms, while electricity use per square foot tends to increase with increasing air purity, this growth is cancelled by the evolution towards larger wafers and mini-environments. The net result is reductions in energy use per area of wafer processed when moving from 200 mm to 300 mm wafer processing. Given the continuing trend towards higher purity standards and growth in high-tech manufacturing, the high growth in secondary energy use suggests that the characterization and management of energy and materials use for purification deserves increased attention.
Keywords :
clean rooms; environmental engineering; purification; semiconductor device manufacture; cleanroom; energy use; input material purification; low-entropy environments; purity standard; semiconductor manufacturing; ultra-high purities realization; ultrapure water; wafer processing; Chemical processes; Energy consumption; Fabrication; Gases; Manufacturing processes; Purification; Semiconductor device manufacture; Semiconductor devices; Semiconductor materials; Thermodynamics; Semiconductor manufacturing; chemicals; cleanrooms; energy use; purity; thermodynamics;
Conference_Titel :
Electronics and the Environment, 2008. ISEE 2008. IEEE International Symposium on
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-2272-2
Electronic_ISBN :
978-1-4244-2298-2
DOI :
10.1109/ISEE.2008.4562913