• DocumentCode
    2114725
  • Title

    Analytic Model of the Deflection of Piezoelectric Unimorph and Bimorph Structures with Numerical Verification

  • Author

    Elata, David ; Elka, Eyal ; Abramovich, Haim

  • Author_Institution
    Fac. of Mech. Eng., Technion-Israel Inst. of Technol., Haifa
  • fYear
    2006
  • fDate
    24-26 April 2006
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The constitutive equations of multi-layered piezoelectric structures are derived in a new form. In this form, the electromechanical coupling is presented as an additional stiffness matrix. This matrix is a true property of the piezoelectric structure and is independent of specific mechanical boundary conditions that may apply to the structure. A novel model of the electromechanical response of such structures is presented. This model accounts for the 3D kinematics of the structure deformation. Solution of example problems using the new model shows excellent agreement with full 3D finite element simulations. These solutions are also compared with the results of previous 2D model approximations presented in literature, and the inaccuracies associated with these previous models are discussed
  • Keywords
    deformation; finite element analysis; piezoelectric materials; piezoelectricity; 3D finite element simulations; 3D kinematics; electromechanical coupling; multilayered piezoelectric structures; piezoelectric bimorph structure; piezoelectric unimorph deflection structure; stiffness matrix; structure deformation; Boundary conditions; Capacitive sensors; Deformable models; Equations; Kinematics; Mechanical engineering; Mechanical factors; Micromechanical devices; Piezoelectric materials; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2006. EuroSime 2006. 7th International Conference on
  • Conference_Location
    Como
  • Print_ISBN
    1-4244-0275-1
  • Type

    conf

  • DOI
    10.1109/ESIME.2006.1643989
  • Filename
    1643989