• DocumentCode
    2114767
  • Title

    A two-phase high step down coupled-inductor converter for next generation low voltage CPU

  • Author

    Matsumoto, K. ; Nishijima, K. ; Sato, T. ; Nabeshima, T.

  • Author_Institution
    Dept. of Electr. & Electr. & Electron. Eng., Oita Univ., Oita, Japan
  • fYear
    2011
  • fDate
    May 30 2011-June 3 2011
  • Firstpage
    2813
  • Lastpage
    2818
  • Abstract
    In this paper, a novel two-phase high step down coupled-inductor converter for next generation low voltage CPU is proposed. This converter has a very high step down characteristic as Vo/Vi= D/4. The switching loss and noise of all switching elements are sufficiently reduced because the drain-source voltages at switching periods are reduced to a quarter of the input source voltage. Low withstand voltage MOSFETs with low on resistance and low Qg(total gate charge) characteristics are possible to use for the all switching elements because the maximum voltage stresses of the main switches and the synchronous rectifier switches are reduced to a half and a quarter of the input source voltage respectively. Further, the branch currents flowed through the paralleled converters are automatically and mostly balanced without the current detection and balance control. The above fine characteristics are simply achieved with three additional capacitors.
  • Keywords
    DC-DC power convertors; microcomputers; power MOSFET; power aware computing; power inductors; rectifiers; switches; switching convertors; voltage regulators; MOSFET; coupled inductor; drain-source voltages; next generation low voltage CPU; paralleled converters; step down converter; switching elements; switching loss; synchronous rectifier switches; Capacitors; Inductance; Inductors; MOSFETs; Rectifiers; Resistance; Switches; CPU; Coupled-inductor; Low voltage and high current; Multi-phase; VR; VRM;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and ECCE Asia (ICPE & ECCE), 2011 IEEE 8th International Conference on
  • Conference_Location
    Jeju
  • ISSN
    2150-6078
  • Print_ISBN
    978-1-61284-958-4
  • Electronic_ISBN
    2150-6078
  • Type

    conf

  • DOI
    10.1109/ICPE.2011.5944777
  • Filename
    5944777