DocumentCode
2114872
Title
Adhesion of Arbitrary-Shaped Thin-Film Microstructures
Author
Bhate, D. ; Dunn, M.
Author_Institution
Sch. of Mech. Eng., Purdue Univ., West Lafayette, IN
fYear
2006
fDate
24-26 April 2006
Firstpage
1
Lastpage
8
Abstract
Microsystems present several challenging reliability-related issues on account of their micron-scale dimensions. Many of these micron sized devices consist of compliant beam- or plate-like microstructures that are in close proximity to a substrate or other structural parts. If such structures come into contact, short-range adhesive forces can pin them together if they cannot be overcome by the elastic restoring forces of the deformed microstructures. This phenomenon of adhesion, often called stiction, depends on the structural response of the micro structure itself, as well as on the nature of the adhesive forces between the contacting surfaces. In this study we develop an approach to model adhesion in microsystems in a computationally feasible finite element environment, and demonstrate its capability via a companion experimental study. The modeling approach adopts the principles of three dimensional linear elastic fracture mechanics (LEFM) and extends it to thin-film plate-like microstructures. Extensive experimental work is done to study the behavior of adhesion in micro structure cantilever beams and square and circular plates. The finite element code is validated against analytically predicted and experimentally observed behavior to corroborate its effectiveness
Keywords
adhesion; beams (structures); cantilevers; finite element analysis; fracture mechanics; micromachining; reliability; stiction; 3D linear elastic fracture mechanics; LEFM; adhesion model; adhesive forces; arbitrary-shaped microstructures; beam-like microstructures; deformed microstructures; elastic restoring forces; finite element environment; micron-scale dimensions; microstructure cantilever beams; plate-like microstructures; reliability-related issues; stiction; thin-film microstructures; Adhesives; Electrostatics; Geometry; Mechanical engineering; Microstructure; Structural beams; Substrates; Switches; Transistors; Wet etching;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2006. EuroSime 2006. 7th International Conference on
Conference_Location
Como
Print_ISBN
1-4244-0275-1
Type
conf
DOI
10.1109/ESIME.2006.1643993
Filename
1643993
Link To Document