Title :
Beam steering mechanism in phased vertical cavity laser arrays
Author :
Johnson, Matthew Thomas ; Siriani, Dominic Francis ; Choquette, Kent D.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois, Urbana, IL, USA
Abstract :
Beam steering with optical phased arrays is accomplished by introducing a relative phase shift between array elements (McManamon et al., 2009). This is typically achieved by altering the refractive index difference between elements, which alters the optical path length of incident radiation traveling through the elements. Beam steering with VCSEL arrays has also been shown to rely on such a refractive index variation (Johnson et al.) which is implemented by adjusting the current injection to the elements. However, if we view the VCSEL array as a waveguide from the active region through the distributed Bragg Reflectors, it can be shown that the index-induced phase shift between elements would only account for less than 1/100th of the observed phase shift. It is thus evident that phased VCSEL arrays rely on a fundamentally different phase-shifting mechanism. To investigate this, we turn to coupled mode theory, which has previously been applied to the dynamics of coupled edge emitting laser arrays and phase tuning in injection-locked VCSELs.
Keywords :
beam steering; distributed Bragg reflector lasers; refractive index; semiconductor laser arrays; surface emitting lasers; VCSEL arrays; active region; array elements; beam steering mechanism; coupled edge emitting laser arrays; coupled mode theory; current injection; distributed Bragg reflectors; incident radiation; index-induced phase shift; injection-locked VCSEL; optical path length; optical phased arrays; phase tuning; phase-shifting mechanism; phased vertical cavity laser arrays; refractive index difference; relative phase shift; Cavity resonators; Laser theory; Phased arrays; Resonant frequency; Semiconductor laser arrays; Vertical cavity surface emitting lasers;
Conference_Titel :
Photonics Conference (IPC), 2013 IEEE
Conference_Location :
Bellevue, WA
Print_ISBN :
978-1-4577-1506-8
DOI :
10.1109/IPCon.2013.6656530