• DocumentCode
    2115365
  • Title

    A study on the effects of BTB HVDC for fault current reduction applied metropolitan area in KEPCO Grid

  • Author

    Ha, Yong Gu ; Jeon, Wong Jae ; Chang, Byung Hoon

  • Author_Institution
    KEPRI, Daejeon, South Korea
  • fYear
    2011
  • fDate
    May 30 2011-June 3 2011
  • Firstpage
    2962
  • Lastpage
    2969
  • Abstract
    The South Korean Power System is characterized by a large percentage of its loads, approximately 43%, being concentrated in the Seoul area, in the northwestern part of the country(metropolitan area), while the largest percentage of the generation is located in the southern part of the country. As such, most of the power typically flows from the southern areas of the grid to the northwestern area. This means long distance power transfer which has the potential to result in voltage instability problems. Therefore, when that area has transmission fault, huge fault current occurs. This problems have been solved by deploying BTB(Back To Back) HVDC. BTB HVDC can divide into two or three systems and control power flow. If BTB is installed at metropolitan area, there are many advantages. Electric power can flow between systems by BTB HVDC. And BTB HVDC can prevent from blackout of the wide area by blocking the spread of the faults. This report shows the effects of BTB HVDC for fault current reduction applied metropolitan area in KEPCO Grid.
  • Keywords
    HVDC power transmission; fault currents; load flow control; power generation control; power grids; power transmission faults; voltage control; BTB; HVDC; KEPCO; South Korean power system; fault current reduction; metropolitan area; power flow control; power grid; power transfer; power transmission fault; voltage instability problems; Asia; Decision support systems; Power electronics; Back To Back (BTB); Fault current; High-voltage dc transmission (HVDC); Voltage sourced converter (VSC);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and ECCE Asia (ICPE & ECCE), 2011 IEEE 8th International Conference on
  • Conference_Location
    Jeju
  • ISSN
    2150-6078
  • Print_ISBN
    978-1-61284-958-4
  • Electronic_ISBN
    2150-6078
  • Type

    conf

  • DOI
    10.1109/ICPE.2011.5944798
  • Filename
    5944798