DocumentCode
2115580
Title
An Influence Of Electron-electron Scatterings To Distribution Functions
Author
Iizuka, T. ; Kato, H. ; Fukuma, M.
Author_Institution
NEC Corporation
fYear
1993
fDate
14-15 May 1993
Firstpage
106
Lastpage
107
Keywords
Acoustic scattering; Distribution functions; Electron mobility; Hot carriers; Impurities; Laboratories; MOSFETs; Microelectronics; National electric code; Phonons;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Process and Device Modeling, 1993. (1993 VPAD) 1993 International Workshop on
Print_ISBN
0-7803-1338-0
Type
conf
DOI
10.1109/VPAD.1993.724742
Filename
724742
Link To Document