DocumentCode :
2115586
Title :
GaN-based lamb-wave mass-sensors on silicon substrates
Author :
Lee, Chi Ming ; Wong, Ka Ming ; Chen, Peng ; Lau, Kei May
Author_Institution :
Electron. & Comput. Eng. Dept., Hong Kong Univ. of Sci. & Technol. (HKUST), Kowloon, China
fYear :
2010
fDate :
1-4 Nov. 2010
Firstpage :
2008
Lastpage :
2011
Abstract :
Lamb-wave mass-sensors were fabricated with MOCVD-grown GaN-based thin films on silicon substrates. Crystalline GaN provides an alternative choice of material for fabricating Lamb-wave sensors. The advantageous properties of this material include high acoustic velocity, high chemical, mechanical and thermal stability, and the potential to integrate with a wide range of GaN-based devices such as high electron mobility transistor (HEMT) circuits, light emitting diodes (LED) and other photonic devices. We successfully developed GaN based Lamb-wave mass-sensors in small size (membrane size of ~1mm × 1mm). The sensors showed good signal strength and mass sensitivity, comparable to other mass-sensors using conventional materials. This novel approach not only allows robust low-cost sensors to be fabricated, but also enables future integration with generic GaN-based devices on the same chip (i.e. lab-on-a-chip).
Keywords :
III-V semiconductors; MOCVD; gallium compounds; silicon; substrates; surface acoustic wave sensors; wide band gap semiconductors; GaN; Lamb-wave mass-sensors; MOCVD; Si; silicon substrates; thin films;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors, 2010 IEEE
Conference_Location :
Kona, HI
ISSN :
1930-0395
Print_ISBN :
978-1-4244-8170-5
Electronic_ISBN :
1930-0395
Type :
conf
DOI :
10.1109/ICSENS.2010.5689946
Filename :
5689946
Link To Document :
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