DocumentCode
2115602
Title
Reliability assessment of dynamical systems with random excitation
Author
Colonius, Fritz ; Kliemann, Wolfgang
Author_Institution
Inst. fur Math., Augsburg Univ., Germany
fYear
1993
fDate
15-17 Dec 1993
Firstpage
3879
Abstract
During recent years, a variety of important interconnections between the theory of nonlinear dynamical systems, nonlinear stochastically excited systems, and nonlinear control systems have been obtained by mathematicians, physicists, and engineers. This paper is the beginning of a systematic study of reliability aspects within the emerging unified view of the different classes of nonlinear dynamical systems. We study the response behavior of dynamical systems with random excitation depending on two parameters: bifurcation parameter αεR , and a parameter ρ⩽0 that measures the strength of the disturbance. The goal of this paper is to obtain precise stability and reliability diagrams in α-ρ-space. In particular, we characterize for each parameter combination the levers that the (maximal) system response will reach with probability 1, with positive probability, or with probability 0. Emphasis is placed on determining the parameter combinations for which the system behavior changes drastically, i.e., on stochastic bifurcation phenomena, to determine crucial system parameters and their critical values
Keywords
bifurcation; dynamics; nonlinear control systems; nonlinear dynamical systems; parameter estimation; probability; reliability; stability; stochastic systems; bifurcation parameters; disturbance; ergodic theory; nonlinear dynamical systems; nonlinear stochastic systems; probability; random excitation; reliability assessment; stability; stochastic bifurcation phenomena; system parameter estimation; Bifurcation; Control systems; Control theory; Fatigue; Nonlinear control systems; Nonlinear dynamical systems; Reliability theory; Stability; Stochastic resonance; Stochastic systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Decision and Control, 1993., Proceedings of the 32nd IEEE Conference on
Conference_Location
San Antonio, TX
Print_ISBN
0-7803-1298-8
Type
conf
DOI
10.1109/CDC.1993.325949
Filename
325949
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