• DocumentCode
    2115651
  • Title

    Low-power and high-speed current-mode CMOS imager with 1T biasing scheme

  • Author

    Tang, Fang ; Bermak, Amine

  • Author_Institution
    Dept. of Electron. & Comput. Eng., Hong Kong Univ. of Sci. & Technol., Hong Kong, China
  • fYear
    2010
  • fDate
    1-4 Nov. 2010
  • Firstpage
    1653
  • Lastpage
    1656
  • Abstract
    A low-power and high-speed current-mode CMOS image sensor is proposed in this paper. Only one column-level transistor is used in the read-out circuit as a current conveyor to bias the in-pixel transistor operating in triode region. As a result, the current-mode read-out circuit is significantly simplified by the proposed structure, while saving the power by more than half. The proposed scheme enables less than 20ns output settling time due to very low impedance at the internal high capacitance bus, leading to fast operating speed. In addition, a relevant CDS technique is also proposed in order to reduce the first order coefficient variation. A test structure is fabricated using a CMOS 0.35μm process.
  • Keywords
    CMOS image sensors; low-power electronics; CMOS image sensor; IT biasing scheme; column-level transistor; current-mode CMOS imager; size 0.35 mum;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2010 IEEE
  • Conference_Location
    Kona, HI
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4244-8170-5
  • Electronic_ISBN
    1930-0395
  • Type

    conf

  • DOI
    10.1109/ICSENS.2010.5689949
  • Filename
    5689949