DocumentCode
2115651
Title
Low-power and high-speed current-mode CMOS imager with 1T biasing scheme
Author
Tang, Fang ; Bermak, Amine
Author_Institution
Dept. of Electron. & Comput. Eng., Hong Kong Univ. of Sci. & Technol., Hong Kong, China
fYear
2010
fDate
1-4 Nov. 2010
Firstpage
1653
Lastpage
1656
Abstract
A low-power and high-speed current-mode CMOS image sensor is proposed in this paper. Only one column-level transistor is used in the read-out circuit as a current conveyor to bias the in-pixel transistor operating in triode region. As a result, the current-mode read-out circuit is significantly simplified by the proposed structure, while saving the power by more than half. The proposed scheme enables less than 20ns output settling time due to very low impedance at the internal high capacitance bus, leading to fast operating speed. In addition, a relevant CDS technique is also proposed in order to reduce the first order coefficient variation. A test structure is fabricated using a CMOS 0.35μm process.
Keywords
CMOS image sensors; low-power electronics; CMOS image sensor; IT biasing scheme; column-level transistor; current-mode CMOS imager; size 0.35 mum;
fLanguage
English
Publisher
ieee
Conference_Titel
Sensors, 2010 IEEE
Conference_Location
Kona, HI
ISSN
1930-0395
Print_ISBN
978-1-4244-8170-5
Electronic_ISBN
1930-0395
Type
conf
DOI
10.1109/ICSENS.2010.5689949
Filename
5689949
Link To Document