DocumentCode :
2115651
Title :
Low-power and high-speed current-mode CMOS imager with 1T biasing scheme
Author :
Tang, Fang ; Bermak, Amine
Author_Institution :
Dept. of Electron. & Comput. Eng., Hong Kong Univ. of Sci. & Technol., Hong Kong, China
fYear :
2010
fDate :
1-4 Nov. 2010
Firstpage :
1653
Lastpage :
1656
Abstract :
A low-power and high-speed current-mode CMOS image sensor is proposed in this paper. Only one column-level transistor is used in the read-out circuit as a current conveyor to bias the in-pixel transistor operating in triode region. As a result, the current-mode read-out circuit is significantly simplified by the proposed structure, while saving the power by more than half. The proposed scheme enables less than 20ns output settling time due to very low impedance at the internal high capacitance bus, leading to fast operating speed. In addition, a relevant CDS technique is also proposed in order to reduce the first order coefficient variation. A test structure is fabricated using a CMOS 0.35μm process.
Keywords :
CMOS image sensors; low-power electronics; CMOS image sensor; IT biasing scheme; column-level transistor; current-mode CMOS imager; size 0.35 mum;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors, 2010 IEEE
Conference_Location :
Kona, HI
ISSN :
1930-0395
Print_ISBN :
978-1-4244-8170-5
Electronic_ISBN :
1930-0395
Type :
conf
DOI :
10.1109/ICSENS.2010.5689949
Filename :
5689949
Link To Document :
بازگشت