• DocumentCode
    2115942
  • Title

    Time-gated technique for contactless electromagnetic interrogation of MEMS resonators

  • Author

    Baù, M. ; Ferrari, V. ; Marioli, D. ; Tonoli, E.

  • Author_Institution
    Dept. of Inf. Eng., Univ. of Brescia, Brescia, Italy
  • fYear
    2010
  • fDate
    1-4 Nov. 2010
  • Firstpage
    1759
  • Lastpage
    1764
  • Abstract
    A novel technique for contactless interrogation of entirely passive micromechanical resonator sensors has been investigated. The technique is based on the separation in time of the excitation and detection phases, exploiting the transient response of the resonator. An interrogation external primary coil is electromagnetically air-coupled to a secondary coil connected to a conductive path running along the edges of the resonator. Firstly the resonator is driven into vibrations during the excitation phase, and then in the detection phase the excitation signal is turned off and the decaying oscillations are contactless sensed. The principle has been modeled by a lumped-element equivalent circuit and then tested on a MEMS SOI microcantilever resonator. The obtained experimental results agree with the predictions of the developed equivalent model and demonstrate a working distance of up to 1 cm. The proposed principle can be exploited for the measurement of physical or chemical quantities affecting the resonant frequency and quality factor of the microresonator.
  • Keywords
    Q-factor measurement; coils; equivalent circuits; micromechanical resonators; microsensors; silicon-on-insulator; transient response; vibrations; MEMS SOI microcantilever resonator; Si; chemical measurement; conductive path running; contactless electromagnetic interrogation; excitation phase; excitation signal; interrogation external primary coil; lumped-element equivalent circuit; passive micromechanical resonator sensor; physical measurement; resonant frequency; secondary coil; time-gated technique; transient response;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2010 IEEE
  • Conference_Location
    Kona, HI
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4244-8170-5
  • Electronic_ISBN
    1930-0395
  • Type

    conf

  • DOI
    10.1109/ICSENS.2010.5689962
  • Filename
    5689962