• DocumentCode
    2116208
  • Title

    Design consideration of 0.4V-operation SOTB MOSFET for super low power application

  • Author

    Makiyama, H. ; Horita, K. ; Iwamatsu, T. ; Oda, H. ; Sugii, N. ; Inoue, Y. ; Yamamoto, Y.

  • Author_Institution
    Low-Power Electron. Assoc. & Project (LEAP), Tsukuba, Japan
  • fYear
    2011
  • fDate
    19-20 May 2011
  • Firstpage
    42
  • Lastpage
    43
  • Abstract
    The silicon on thin buried oxide (SOTB) CMOS is suited for ultralow-voltage operation of CMOS circuits, that is required for drastic power reduction of LSIs because of its small variability and adaptive back bias controllability. In this study, we show that the design concept of threshold voltage for ultralow-voltage (Vdd=0.4V) operation of SOTB. To achieve a good trade-off of Ion and Ioff, gate work function (ΦWF) should be controlled at 4.25-4.35eV and 4.90-5.05eV for N- and P-type MOS-FETs (NMOS and PMOS), respectively. Moreover, higher Nsub is preferable for increasing Ion. Our optimized design achieved that Ion values 170 and 89 μA/μm at Ioff values of 5.6 and 7.8 pA/μm for NMOS and PMOS, respectively. This result indicates that the 0.4-v operation is possible without paying significant speed penalty from the conventional 1-V operation.
  • Keywords
    CMOS integrated circuits; MOSFET; elemental semiconductors; large scale integration; low-power electronics; silicon; LSI; N-type MOSFET; P-type MOSFET; SOTB CMOS circuit; Si; electron volt energy 4.25 eV to 4.35 eV; electron volt energy 4.90 eV to 5.05 eV; power reduction; silicon on thin buried oxide CMOS circuit; super low power application; ultralow-voltage operation; voltage 0.4 V; voltage 1 V; CMOS integrated circuits; Logic gates; MOS devices; Power MOSFET; Threshold voltage; Transistors; SOI; Ultra-low power;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Future of Electron Devices, Kansai, (IMFEDK), 2011 International Meeting for
  • Conference_Location
    Osaka
  • Print_ISBN
    978-1-61284-145-8
  • Electronic_ISBN
    978-1-61284-147-2
  • Type

    conf

  • DOI
    10.1109/IMFEDK.2011.5944835
  • Filename
    5944835