• DocumentCode
    2116469
  • Title

    Analytical and Numerical Analysis of Drop Impact Behavior for a Portable Electronic Device

  • Author

    Zhou, Jiang ; Sharan, Kallolimath ; Lahoti, Sachin

  • Author_Institution
    Dept. of Mech. Eng., Lamar Univ., Beaumont, TX
  • fYear
    2006
  • fDate
    24-26 April 2006
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    Dynamic performance during drop impact is a great concern to semiconductor and electronic product manufacturers, especially for portable devices such as mobile phones. In this paper, the drop impact response of a mobile phone is investigated by an analytical dynamics model. In order to capture some most important affected factors, we decouple this problem to be a two-step analysis. First, finite element analysis is used to determine the effective stiffness for housing and PCB board, respectively. Second, a two-degree-of-freedom analytical dynamic model is developed to investigate the drop impact response. Such an approach allows parametric analysis to determine the important design parameters, which are important to the preliminary selection of geometries and materials of PCB boards and stiffness of housings so that the dynamic stability is maintained. Board level finite element analysis is also performed using input-acceleration model. The results are in good agreement with the analytical model results developed above. Finally, both methods are applied to evaluate the dynamic response of a commercially used cellular phone
  • Keywords
    finite element analysis; impact testing; mobile handsets; portable instruments; PCB board; cellular phone; drop impact behavior; electronic product manufacturing; finite element analysis; input-acceleration model; portable device; portable electronic device; semiconductor manufacturing; Acceleration; Analytical models; Cellular phones; Finite element methods; Geometry; Mobile handsets; Numerical analysis; Packaging; Performance analysis; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2006. EuroSime 2006. 7th International Conference on
  • Conference_Location
    Como
  • Print_ISBN
    1-4244-0275-1
  • Type

    conf

  • DOI
    10.1109/ESIME.2006.1644050
  • Filename
    1644050