• DocumentCode
    2116625
  • Title

    Effects Of Physical Models On Bipolar AC Characteristics

  • Author

    Shigyo, Naoyuki ; Niitsu, Youichirou

  • Author_Institution
    Toshiba Corporation
  • fYear
    1993
  • fDate
    14-15 May 1993
  • Firstpage
    114
  • Lastpage
    115
  • Keywords
    Bipolar transistors; Current measurement; Current-voltage characteristics; Cutoff frequency; Frequency measurement; Impurities; Integrated circuit modeling; Photonic band gap; Solid modeling; Ultra large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Process and Device Modeling, 1993. (1993 VPAD) 1993 International Workshop on
  • Print_ISBN
    0-7803-1338-0
  • Type

    conf

  • DOI
    10.1109/VPAD.1993.724746
  • Filename
    724746
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2116625