DocumentCode :
2116741
Title :
The Role of Simulation in Failure Prediction and Design Optimization in Electronics Packaging
Author :
Tay, Andrew A O
Author_Institution :
Dept. of Mech. Eng., National Univ. of Singapore
fYear :
2006
fDate :
24-26 April 2006
Firstpage :
1
Lastpage :
8
Abstract :
This paper discusses the role of computer simulation in predicting failure and in optimizing design in electronics packaging. The role played by simulation in predicting failure is illustrated by the use of the fracture mechanics approach in predicting delamination in plastic IC packages undergoing solder reflow. The role played by simulation in optimizing design of IC packages is illustrated by a parametric study of the effect of compliance on the reliability of copper column interconnected wafer level packages. Based on this study, a novel interconnect design is proposed where the interconnect compliance varies continuously from a low value at the centre of the chip to a high value at the perimeter of the chip
Keywords :
delamination; electronics packaging; failure analysis; plastic packaging; reflow soldering; delamination; electronics packaging; failure prediction; interconnect design; plastic IC packages; solder reflow; wafer level packages; Computational modeling; Computer simulation; Delamination; Design optimization; Electronics packaging; Integrated circuit packaging; Parametric study; Plastic integrated circuit packaging; Predictive models; Wafer scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2006. EuroSime 2006. 7th International Conference on
Conference_Location :
Como
Print_ISBN :
1-4244-0275-1
Type :
conf
DOI :
10.1109/ESIME.2006.1644060
Filename :
1644060
Link To Document :
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