Title :
BIST using Cellular Automata as test pattern generator and response compaction
Author :
Gao, Lixin ; Zhang, Yongliang ; Zhao, Jinhong
Author_Institution :
Sch. of Inf. Eng., Guangdong Jidian Polytech., Guangzhou, China
Abstract :
In the Built-in self-test (BIST), a pseudo-random generator is used to apply test vectors to the circuit under test and a data compactor is used to produce a signature. This paper verifies that a linear hybrid Cellular Automata (CA) as a test pattern generator has a maximum length cycle and better random properties, and such CA as a signature analyzer have the same aliasing properties as linear feedback shift registers.
Keywords :
automatic test pattern generation; built-in self test; cellular automata; logic analysers; random number generation; BIST; aliasing property; built-in self test; cellular automata; circuit under test; data compactor; linear feedback shift register; maximum length cycle; pseudorandom generator; response compaction; signature analyzer; test pattern generator; test vector; Automata; Built-in self-test; Circuit faults; Generators; Polynomials; Test pattern generators; Vectors; BIST; aliasing; cellular automata; fault coverage; maximal length cycle; random;
Conference_Titel :
Consumer Electronics, Communications and Networks (CECNet), 2012 2nd International Conference on
Conference_Location :
Yichang
Print_ISBN :
978-1-4577-1414-6
DOI :
10.1109/CECNet.2012.6201620
