DocumentCode :
2116801
Title :
Multiband imaging photometer for SIRTF: an overview of the verification and validation effort
Author :
Glenn, Thomas S. ; Heim, Gerald B. ; Troeltzsch, John ; Unruh, Bryce W. ; Winghart, Jeremiah ; Bean, J. Doug ; Rieke, George B. ; Kelly, Doug M.
Author_Institution :
Ball Aerosp. & Technol. Corp., Boulder, CO, USA
Volume :
1
fYear :
2003
fDate :
March 8-15, 2003
Firstpage :
1
Abstract :
Verification and validation (V&V) of the Multiband Imaging Photometer for SIRTF (MIPS) instrument, one of three science instruments on-board the Space Infrared Telescope Facility (SIRTF), provided a variety of challenges during the various integration and test phases. The MIPS instrument provides imaging in the far infrared optical spectrum, with photometry and total power measurement in spectral bands centered at 24, 70, and 160 μm, and low-resolution spectroscopy between 50 and 95 μm. A single, one axis scan mirror detects the light to three detectors, a 128×128 Si:As BIB, 32×32 Ge:Ga, and 2×20 stressed Ge:Ga. Our V&V challenges can be categorized into three areas: 1) thermal constraints - focal planes require temperatures in the 1.5 - 2.0K to operate, 2) data processing - analyzing and managing high data volumes, and 3) personnel - staffing a limited budget test and software maintenance effort. This paper presents an overview of the MIPS instrument test program from standalone instrument testing through integration with the spacecraft and integrated observatory level testing. For each testing phase, goals, methodologies, test tools, and lessons learned are presented. Proper test personnel staffing and parallel software development issues are emphasized. In addition, we should look forward to post-launch support and see how to bring the lessons learned in earlier phases forward.
Keywords :
aerospace instrumentation; aerospace testing; astronomical photometry; formal verification; infrared spectrometers; 1.5 to 2.0 K; 160 micrometer; 24 micrometer; 50 micrometer; 70 micrometer; 95 micrometer; Ge:Ga; MIPS; SIRTF; Si:As; far infrared optical spectrum; focal planes; instrument test program; instrument testing; limited budget test; low-resolution spectroscopy; multiband imaging photometer; observatory level testing; post-launch support; power measurement; scan mirror; software development; software maintenance; space infrared telescope facility; spectral bands; test personnel staffing; thermal constraints; Infrared imaging; Infrared spectra; Instruments; Optical imaging; Optical variables control; Personnel; Photometry; Software testing; Telescopes; Thermal management;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Aerospace Conference, 2003. Proceedings. 2003 IEEE
ISSN :
1095-323X
Print_ISBN :
0-7803-7651-X
Type :
conf
DOI :
10.1109/AERO.2003.1235046
Filename :
1235046
Link To Document :
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