DocumentCode :
2116869
Title :
Computational Challenges for Reliability Assessment of Next-Generation Micro & Nano Systems
Author :
Dasgupta, Abhijit
Author_Institution :
Dept. of Mech. Eng., Maryland Univ., College Park, MD
fYear :
2006
fDate :
24-26 April 2006
Firstpage :
1
Lastpage :
3
Abstract :
The computational engineering community is facing new modeling challenges because the advent of nanotechnology is clearly demonstrating the limitations of classical continuum mechanics. The discrete nature of matter leads to nonlinear and scale-dependent phenomena at the nanoscale, which cannot be captured in simple homogenization schemes such as those used in classical continuum mechanics. Discrete molecular or atomistic modeling clearly indicates the reasons for the inadequacies of classical continuum mechanics. However, discrete modeling still requires intense computational investment that limits its use to problems of very small length scales (sub-microns) and very short time scales (nanoseconds). Thus, although discrete modeling is a valuable technique to gain fundamental scientific insights into nanoscale phenomena, it is not a feasible strategy over length scales and time scales that are important in nanoscale problems of engineering significance. For example, it is still computationally infeasible to construct a discrete atomistic model of a complete nano-electronic device for design optimization purposes. It is equally difficult to develop a discrete molecular description of the construction of a nano-bio sensor that is based on the self-assembly of hundreds of protein molecules onto a functionalized gold substrate. As a final example, consider the difficulty of developing a discrete molecular model of a composite nanodielectric consisting of hundreds of nanoparticles embedded in a continuous matrix material. Clearly, a formal framework is needed to bridge between discrete molecular modeling and classical continuum modeling, for nano-engineering problems
Keywords :
biosensors; continuum mechanics; integrated circuit design; integrated circuit reliability; nanoparticles; nanotechnology; classical continuum mechanics; composite nanodielectric; computational engineering; design optimization; discrete atomistic modeling; discrete molecular modeling; nanobio sensor; nanoelectronic device; protein molecules; reliability assessment; Design optimization; Gold; Investments; Nanoscale devices; Nanotechnology; Protein engineering; Reliability engineering; Self-assembly; Sensor phenomena and characterization; Systems engineering and theory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2006. EuroSime 2006. 7th International Conference on
Conference_Location :
Como
Print_ISBN :
1-4244-0275-1
Type :
conf
DOI :
10.1109/ESIME.2006.1644065
Filename :
1644065
Link To Document :
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