Title :
Lower limb movement asymmetry measurement with a depth camera
Author :
Auvinet, E. ; Multon, Franck ; Meunier, Jean
Author_Institution :
Biomed. Eng. Inst., Univ. de Montreal, Montreal, QC, Canada
fDate :
Aug. 28 2012-Sept. 1 2012
Abstract :
The gait movement seems simple at first glance, but in reality it is a very complex neural and biomechanical process. In particular, if a person is affected by a disease or an injury, the gait may be modified. The left-right asymmetry of this movement can be related to neurological diseases, segment length differences or joint deficiencies. This paper proposes a novel method to analyze the asymmetry of lower limb movement which aims to be usable in daily clinical practice. This is done by recording the subject walking on a treadmill with a depth camera and then assessing left-right depth differences for the lower limbs during the gait cycle using horizontal flipping and registration of the depth images half a gait cycle apart. Validation on 20 subjects for normal gait and simulated pathologies (with a 5 cm sole), showed that this system is able to distinguish the asymmetry introduced. The major interest of this method is the low cost of the material needed and its easy setup in a clinical environment.
Keywords :
gait analysis; medical disorders; motion measurement; patient diagnosis; depth camera; depth image registration; gait movement; horizontal flipping; joint deficiencies; left-right depth differences; left-right movement asymmetry; lower limb movement asymmetry measurement; neurological diseases; segment length differences; Biomedical measurements; Cameras; Conferences; Foot; Indexes; Legged locomotion; Optical imaging; Algorithms; Biomechanical Phenomena; Gait; Humans; Image Processing, Computer-Assisted; Imaging, Three-Dimensional; Lower Extremity; Models, Anatomic; Models, Statistical; Movement; Reproducibility of Results; Video Recording; Walking;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-4119-8
Electronic_ISBN :
1557-170X
DOI :
10.1109/EMBC.2012.6347554