DocumentCode :
2117705
Title :
Design and analysis of a robust all-digital clock generation system with a DLL-based TDC
Author :
Han, Yizhi ; Rhee, Woogeun ; Wang, Zhihua
Author_Institution :
Inst. of Microelectron., Tsinghua Univ., Beijing, China
fYear :
2012
fDate :
21-23 April 2012
Firstpage :
3152
Lastpage :
3156
Abstract :
A PVT-insensitive all-digital clock generation system architecture has been presented. As a key block in ADPLL, the TDC is based on DLL and can exactly cover one period of ADPLL output. Compared to conventional open-loop TDC, the proposed one significantly reduces INL of delay line to decrease fractional spur of ADPLL. Besides that, thermometer output of proposed one makes phase information simpler to process while conventional one needs more calculation. Designed in 65nm, detailed schematic of TDC is shown. Layout of ADPLL takes an area of 0.71mm2. TDC occupies 0.05 mm2 while has a power consumption of 2.1 mW.
Keywords :
delay lines; digital phase locked loops; frequency synthesizers; thermometers; time-digital conversion; ADPLL; DLL; PVT; TDC; all-digital clock generation system; delay line; phase information; power 2.1 mW; size 65 nm; thermometer; Delay; Delay lines; Frequency modulation; Layout; Phase locked loops; Phase noise; Quantization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Consumer Electronics, Communications and Networks (CECNet), 2012 2nd International Conference on
Conference_Location :
Yichang
Print_ISBN :
978-1-4577-1414-6
Type :
conf
DOI :
10.1109/CECNet.2012.6201657
Filename :
6201657
Link To Document :
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