DocumentCode
2117780
Title
Double diffraction coefficients for source and observation at finite distance for a pair of wedges
Author
Albani, M. ; Capolino, F. ; Maci, S. ; Tiberio, R.
Author_Institution
Dept. of Electr. Eng., Florence Univ., Italy
Volume
2
fYear
1995
fDate
18-23 June 1995
Firstpage
1352
Abstract
A closed form, high-frequency solution is presented for describing the double diffraction mechanism at a pair of parallel wedges, when they are illuminated by a spherical wave. The solution is obtained by using a spherical waves spectral representation of the first order diffracted field from each wedge. For the sake of simplicity, only the scalar case is considered when either hard or soft boundary conditions may be imposed on the faces of the two wedges. This provides a basic step for constructing the solution in the more general electromagnetic case. Although the procedure is applicable to any couple of parallel wedges, the case of two wedges sharing a common face is explicitly considered in the solution presented. The asymptotic evaluation of the double spectral integral leads to transition functions involving generalized Fresnel integrals. Numerical calculations show that the high frequency formulation fails so gracefully that it gradually blends into the solution of a single wedge when the distance between the two edges vanishes. This is a desirable property for analysing the shadowing effects of a thick screen.
Keywords
Fresnel diffraction; electromagnetic fields; electromagnetic wave diffraction; integral equations; asymptotic evaluation; closed form high-frequency solution; double diffraction coefficients; double diffraction mechanism; double spectral integral; electromagnetic wave difraction; finite distance; first order diffracted field; generalized Fresnel integrals; hard boundary condition; observation; parallel wedges; shadowing effects; soft boundary condition; source; spectral representation; spherical wave illumination; thick screen; transition functions; Boundary conditions; Educational institutions; Electromagnetic diffraction; Frequency; Fresnel reflection; Geometry; Shadow mapping;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 1995. AP-S. Digest
Conference_Location
Newport Beach, CA, USA
Print_ISBN
0-7803-2719-5
Type
conf
DOI
10.1109/APS.1995.530271
Filename
530271
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