DocumentCode
2118182
Title
Efficient simulation of the effect of random metrology errors on a sparse aperture system
Author
Tasker, Frederick ; Plourde, Bert ; Palecki, Lou ; Reed, Anne
Author_Institution
Assurance Technology
Volume
4
fYear
2003
fDate
March 8-15, 2003
Keywords
Apertures; Error analysis; Error correction; Fast Fourier transforms; Frequency; Metrology; Optical control; Optical feedback; Optical imaging; Transfer functions;
fLanguage
English
Publisher
ieee
Conference_Titel
Aerospace Conference, 2003. Proceedings. 2003 IEEE
ISSN
1095-323X
Print_ISBN
0-7803-7651-X
Type
conf
DOI
10.1109/AERO.2003.1235108
Filename
1235108
Link To Document